The GE HiSpeed LX/i CT scanner is a single-slice computed tomography system designed to deliver high-quality imaging for routine diagnostic applications. It features a 70 cm gantry aperture with a ±30° tilt capability, allowing for flexible patient positioning.
The system utilizes HiLight solid-state detectors and a Solarix X-ray tube with a heat capacity of 3.5 MHU, supporting scan times as short as 1 second. It offers scan thickness options of 1, 2, 3, 5, 7, and 10 mm, with tube voltage settings of 80, 120, and 140 kVp, and tube current ranging from 10 to 250 mA in 10 mA increments.
The HiSpeed LX/i is equipped with a Silicon Graphics O2 workstation and a 21-inch color monitor, facilitating real-time image processing capabilities such as multiplanar reformation (MPR) and maximum intensity projection (MIP). It supports DICOM standards for printing and data transfer, and includes features like auto-filming, auto-store, auto-archive, and auto-transfer to streamline workflow.
These attributes make the HiSpeed LX/i suitable for diagnostic centers seeking reliable performance in general imaging tasks.
Spec
CT Type: GE HiSpeed LX/I CT
Year of Manufacture: 1998
Tube Type: MX 165 3.5MHU X-Ray Tube
Gantry count: 850,050 Exposures on the Gantry
Accessories: Advantage Workstation 1.2; Solid-State Detectors
